Skip to main content

Microscopy Services

U.S.-based organizations can submit samples for characterization using the National Laboratory of the Rockies' specialized microscopy and imaging capabilities.

Our tools include transmission and scanning electron microscopes, focused ion beam microscopes, and electro-optical imaging tools. Learn more about our analytical microscopy and imaging science capabilities.

Services Available for Sample Analysis

A video shows how femtosecond laser milling and plasma beam milling/polishing can extract a chunk of material from a region of interest for 3D analysis. Video by Renae Gannon, National Laboratory of the Rockies

  • Laser plasma focused ion beam cross-sectional imaging and analysis 
  • Laser plasma focused ion beam chunk lift-out 3D imaging and analysis
  • Laser plasma focused ion beam buried cross-section lift-out for (scanning) transmission electron microscopy
  • Argon plasma focused ion beam lift-out for (scanning) transmission electron microscopy
  • Oxygen plasma focused ion beam lift-out for (scanning) transmission electron microscopy
  • Cryogenic scanning transmission electron microscopy imaging and analysis
  • 4D-scanning transmission electron microscopy (4D-STEM) analysis
  • Operando freezing of coin cells for cryogenic electron microscopy
  • Photovoltaic cell and module electro-optical imaging.

Each service has additional options to customize the scope of work and requested data. For detailed specifications and pricing information, see an example of the microscopy services agreement.

Ordering Process

Microscopic laser PFIB cross-section showing a milled trench and horizontal material layers, with a 500 micrometer scale bar.

To begin the sample submission process, send a message to the contact email below detailing your request. Someone from the National Laboratory of the Rockies’ MICRO group will contact you to arrange an intake meeting and discuss the scope of work and requested data.

Once the samples are shipped to the laboratory, the MICRO group will provide an estimated timeline, conduct the requested services, and then schedule a summary meeting to review the results and data.

Samples may be returned upon request for an additional cost. Return shipping costs are not included in the service pricing because sample size, volume, weight, and hazards may vary significantly.

At this time, orders may be initiated only by U.S. institutions.

Contact

To request a measurement, contact microscopy.imaging@nlr.gov.


Share

Last Updated July 7, 2026